REVIEW OF SUBMICRON VLSI CAD SOFTWARE AND ACCOUNTING FOR ELECTROPHYSICAL EFFECTS OF DEEP SUBMICRON LEVEL

Zolnikov V.; Savchenko Andrey; Kulay A.

doi:doi:10.12737/article_5d639c80e25143.41546387

REVIEW OF SUBMICRON VLSI CAD SOFTWARE AND ACCOUNTING FOR ELECTROPHYSICAL EFFECTS OF DEEP SUBMICRON LEVEL

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REVIEW OF SUBMICRON VLSI CAD SOFTWARE AND ACCOUNTING FOR ELECTROPHYSICAL EFFECTS OF DEEP SUBMICRON LEVEL

Journal: MODELING OF SYSTEMS AND PROCESSES Volume 12 № 1 , 2019

Rubrics: TEHNICHESKIE NAUKI

UDK 60 Прикладные науки. Общие вопросы

Zolnikov V. ¹

Savchenko Andrey ²

Kulay A. ³

Author and publication information

Authors:

1. Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation

2. AO «Nauchno-issledovatel'skiy institut mikropriborov» (g. Moskva)

3. AO «Nauchno-issledovatel'skiy institut elektronnoy tehniki»

Type:

Article

DOI:

https://doi.org/10.12737/article_5d639c80e25143.41546387

Pages:

from 40 to 47

Status:

Published

Received:

22.08.2019

Accepted:

26.08.2019

Published:

26.08.2019

Subject area:

UDK 60 Прикладные науки. Общие вопросы

Language:

Russian

Keywords:

Sistemy avtomatizirovannogo proektirovaniya (SAPR), SBIS, Cadence Design Systems, Mentor Graphics, Synopsys, elektrofizicheskie effekty, gluboko submikronnyy uroven'.

Abstract and keywords

Abstract (English):
V stat'e rassmatrivayutsya harakteristiki i funkcii sovremennyh sistem avtomatizirovannogo proektirovaniya submikronnyh SBIS. Osnovnymi firmami-razrabotchikami sistem dannogo klassa yavlyayutsya Cadence Design Systems, Mentor Graphics i Synopsys. Proanalizirovany elektrofizicheskie effekty submikronnogo urovnya, kotorye neobhodimo uchityvat' pri razrabotke SBIS.

Keywords:
Sistemy avtomatizirovannogo proektirovaniya (SAPR), SBIS, Cadence Design Systems, Mentor Graphics, Synopsys, elektrofizicheskie effekty, gluboko submikronnyy uroven'.

References

1. Obzor programm dlya SAPR submikronnyh SBIS / V.A. Sklyar, K.V. Zol'nikov, V.V. Lavlinskiy, S.A. Evdokimova, V.I. Anciferova // Modelirovanie sistem i processov. - 2013. - № 2. - S. 72-76.

2. Obzor sredstv SAPR dlya submikronnyh SBIS / V.A. Sklyar, K.V. Zol'nikov, I.V. Nagornyy, V.V. Lavlinskiy // Modelirovanie sistem i processov. - 2012. - № 1. - S. 60-64.

3. Lisyak, V. V. Programmnye produkty SAPR ustroystv s programmiruemoy logikoy / V. V. Lisyak, N. K. Lisyak // Izvestiya YuFU. Tehnicheskie nauki. - 2014. - № 7 (156). - S. 93-101.

4. EDA Tools and IP for System Design Enablement | Cadence. - Rezhim dostupa: https://www.cadence.com/. - Zagl. s ekrana.

5. Mentor, a Siemens Business, leads in electronic design automation software - Mentor Graphics. - Rezhim dostupa: https://www.mentor.com/. - Zagl. s ekrana.

6. Synopsys. - Rezhim dostupa: https://www.synopsys.com/. - Zagl. s ekrana.

7. Sklyar, V. A. Uchet elektrofizicheskih effektov submikronnogo urovnya pri proektirovanii sovremennyh SBIS / V.A. Sklyar, K.V. Zol'nikov, I.V. Nagornyy // Modelirovanie sistem i processov. - 2012. - № 3. - S. 42-44.

8. Issledovanie vliyaniya razbrosa tehnologicheskih parametrov SBIS na stoykost' k effektam nakoplennoy dozy radiacii s pomosch'yu sredstv priborno-tehnologicheskogo modelirovaniya / A.V. Seleckiy, N.A. Shelepin, A.A. Smolin, A.V. Ulanova // Problemy razrabotki perspektivnyh mikro- i nanoelektronnyh sistem (MES). - 2016. - № 4. - S. 178-183.

9. Gavrilov, S. V. Metody uskorennoy harakterizacii bibliotek elementov SBIS s kontrolem zadannoy tochnosti / S. V. Gavrilov, O. N. Gudkova, Yu. B. Egorov // Izvestiya vysshih uchebnyh zavedeniy. Elektronika. - 2010. - № 3 (83). - S. 51-60.

10. Harakterizaciya i modelirovanie signalov v SAPR / V. A. Sklyar, V. K. Zol'nikov, A. I. Yan'kov, Yu. A. Chevychelov, V. F. Barabanov // Modelirovanie sistem i processov. - 2018. - T. 11, № 1. - S. 62-67.

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