DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016

Konstantin V. Zolnikov; A. S. Yagodkin; Svetlana A. Evdokimova; Tatyana V. Skvortsova

doi:10.12737/2219-0767-2020-13-1-46-53

UDC 60

DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016

Published in Modeling of systems and processes · Volume 13, Issue 1 · Pages 46–53 · Rubric: Tehnicheskie nauki

DOI: https://doi.org/10.12737/2219-0767-2020-13-1-46-53

Received: 26.05.2020 Accepted: 24.03.2024

Authors

Konstantin V. Zolnikov

A. S. Yagodkin

Svetlana A. Evdokimova

Tatyana V. Skvortsova

Konstantin V. Zolnikov

Voronezh State University of Forestry and Technologies named after G.F. Morozov Russian Federation

A. S. Yagodkin

Voronezh State University of Forestry and Technologies named after G.F. Morozov Voronezh

Svetlana A. Evdokimova

Academic degree: candidate of technical sciences

Voronezh State University of Forestry and Technologies named after G.F. Morozov Voronezh

Tatyana V. Skvortsova

Voronezh State University of Forestry and Technologies named after G.F. Morozov Voronezh

ABSTRACT

The article is devoted to the process of creating microelectronic devices and analyzing methods and criteria for product rejection. We consider procedures that ensure high quality of work of chip design processes and their serial production. The result of the analysis of domestic and foreign patents for multi-core processor systems is presented.

KEYWORDS

VLSI 1867VN016, design, microelectronics, efficiency, quality, technological process

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JATS XML

Editor-in-Chief, editorial board chair

GOST

Zolnikov K. V., Yagodkin A. S., Evdokimova S. A., Skvortsova T. V. DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016 // Modeling of systems and processes. 2020. no. 1. pp. 46-53. DOI: https://doi.org/10.12737/2219-0767-2020-13-1-46-53. (Date of access 19.09.2026).

MLA

Konstantin V. Zolnikov, Yagodkin A. S., Evdokimova S. A., Skvortsova T. V.. "DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016." Modeling of systems and processes 13.1 (2020): 46-53. DOI: https://doi.org/10.12737/2219-0767-2020-13-1-46-53.

APA

Zolnikov K. V., Yagodkin A. S., Evdokimova S. A., Skvortsova T. V. (2020). DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016. Modeling of systems and processes, 13(1), 46-53. https://doi.org/10.12737/2219-0767-2020-13-1-46-53

Chicago

Konstantin V. Zolnikov, Yagodkin A. S., Evdokimova S. A., Skvortsova T. V.. "DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016." Modeling of systems and processes 13, no. 1 (2020): 46-53. https://doi.org/10.12737/2219-0767-2020-13-1-46-53.

WIKI

{{cite journal | author = Zolnikov K. V., Yagodkin A. S., Evdokimova S. A., Skvortsova T. V. | title = DEFINITION OF MEASURES FOR THE QUALITY ASSURANCE PROGRAM FOR THE DESIGN AND SERIAL PRODUCTION OF CHIPS AND EVALUATION OF THEIR EFFECTIVENESS ON THE EXAMPLE OF VLSI 1867VN016 | journal = Modeling of systems and processes | year = 2020 | volume = 13 | issue = 1 | pages = 46-53 | doi = 10.12737/2219-0767-2020-13-1-46-53 }}

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