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DEVELOPMENT OF A TEST CRYSTAL IN THE DESIGN OF CMOS TECHNOLOGY CHIPS
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DEVELOPMENT OF A TEST CRYSTAL IN THE DESIGN OF CMOS TECHNOLOGY CHIPS
UDK 60 Прикладные науки. Общие вопросы
Zolnikov V. 1
Oksyuta O. 2
Chubur K. 3
Kvasov Oleg Nikolaevich 4
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
3.  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
4.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Type:
Article
DOI:
https://doi.org/10.12737/2219-0767-2020-13-3-58-65
Pages:
from 58 to 65
Status:
Published
Received:
07.12.2020
Accepted:
07.12.2020
Published:
07.12.2020
Subject area:
UDK 60 Прикладные науки. Общие вопросы
Language:
Russian
Keywords:
crystals ULA, the blocks of the test crystal, the unit test elements of the input-output block of test elements of the kernel, block, ring generators, ring generator
Abstract and keywords
Abstract (English):
The article discusses methods and technologies for testing chips using test crystals and describes the structure of such crystals developed as a chip for research. Diagrams of the I / O element verification block, the core element verification block, and the ring generator block, as well as diagrams of a number of ring generators, are presented.

Keywords:
crystals ULA, the blocks of the test crystal, the unit test elements of the input-output block of test elements of the kernel, block, ring generators, ring generator
References

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2. Zol'nikov, V.K. Verifikaciya proektov i sozdanie testovyh posledovatel'nostey dlya proektirovaniya mikroshem / V.K. Zol'nikov, S.A. Evdokimova, T.V. Skvorcova // Modelirovanie sistem i processov. - 2019. - T. 12, № 1. - S. 10-16.

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