AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"
Russian Federation
Voronezh, Russian Federation
Russian Federation
The article considers the issues of reliability control in the development of chips. A reliability control scheme is provided for analyzing the States of major elements and accounting for failures. The paper describes the rejection tests, the sequence of their conduct, as well as the results of the analysis of methods and conditions of testing
ICS, reliability, design, interface, burn-in testing
1. Konstrukciya i tehnologiya mikroshem kosmicheskogo naznacheniya / V. K. Zol'nikov, A. Yu. Kulay, I. I. Strukov, K. A. Chubur, Yu. A. Chevychelov, S. V. Grechanyy // Informacionno-sensornye sistemy v teplofizicheskih issledovaniyah: sbornik trudov nauchnoy konferencii. - Tambov: TGTU, 2018. - S. 229-232.
2. Yan'kov, A.I. Metody ispytaniy sovremennyh SBIS / A.I. Yan'kov, V.K. Zol'nikov, V.E. Mezhov // Modelirovanie sistem i processov. - 2013. - № 1. - S. 67-69.
3. Obobschennaya metodika proektirovaniya tehnicheskih blokov vysokonadezhnyh programmno-tehnicheskih kompleksov special'nogo naznacheniya / V.K. Zol'nikov, D.M. Utkin, S.A. Evdokimova, V.I. Anciferova // Radiacionnaya stoykost' elektronnyh sistem «Stoykost'-2014» : sbornik tezisov dokladov 17-y Vserossiyskoy nauchno-prakticheskoy konferencii po radiacionnoy stoykosti elektronnyh sistem. - M. : Nacional'nyy issledovatel'skiy yadernyy universitet «MIFI», 2014. - S. 71-72.
4. Shemotehnicheskiy bazis i proverka mikroshem na rabotosposobnost' / V.K. Zol'nikov, S.A. Evdokimova, A.V. Fomichev, V.N. Chikin, A.V. Achkasov, V.F. Zinchenko // Modelirovanie sistem i processov. - 2018. - T. 11, № 4. - S. 25-30.
5. Otbrakovochnye ispytaniya kak sredstvo povysheniya nadezhnosti partiy IS / M. Gorlov, A. Strogonov, S. Arsent'ev, V. Emel'yanov, V. Plebanovich // Tehnologii v elektronnoy promyshlennosti. - 2006. - № 1 (7). - S. 70-75.
6. Achkasov, V.N. Obobschennyy kriteriy nadezhnosti integral'nyh shem i metody zaschity ot odinochnyh sboev v cifrovyh ustroystvah na stadii proektirovaniya / V.N. Achkasov, V.A. Smerek, D.M. Utkin // Politematicheskiy setevoy elektronnyy nauchnyy zhurnal Kubanskogo gosudarstvennogo agrarnogo universiteta. - 2012. - № 76. - S. 387-398.
7. Popov, V. D. Podhod k prognozirovaniyu nadezhnosti integral'nyh mikroshem pri radiacionnom vozdeystvii / V.D. Popov // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2011. - № 1. - S. 9-11.
8. Rezul'taty ocenki nadezhnosti mikroshemy 1921VK028 / V.K. Zol'nikov, S.A. Evdokimova, E.V. Grosheva, A.I. Yan'kov // Modelirovanie sistem i processov. - 2019. - T. 12,№ 4. - S. 37-41.
9. Rezul'taty ocenki nadezhnosti mikroshemy 1921VK035 / V.K. Zol'nikov, S.A. Evdokimova, E.V. Grosheva, A.I. Yan'kov // Modelirovanie sistem i processov. - 2019. -T. 12, № 4. - S. 42-46.
