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DETERMINATION OF STRUCTURES IN CHIPS THAT ARE SENSITIVE TO COSMIC PARTICLES
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DETERMINATION OF STRUCTURES IN CHIPS THAT ARE SENSITIVE TO COSMIC PARTICLES
UDK 62 Инженерное дело. Техника в целом. Транспорт
Savchenko Andrey 1
Kulay A. 2
Strukov I. 3
Chubur K. 4
Grechanyy Sergey Vladimirovich 5
Authors:
1.  AO «Nauchno-issledovatel'skiy institut mikropriborov» (g. Moskva)

2.  AO «Nauchno-issledovatel'skiy institut elektronnoy tehniki»

3.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
4.  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
5.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Type:
Article
DOI:
https://doi.org/10.12737/2219-0767-2020-12-4-73-77
Pages:
from 73 to 77
Status:
Published
Received:
23.01.2020
Accepted:
23.01.2020
Published:
23.01.2020
Subject area:
UDK 62 Инженерное дело. Техника в целом. Транспорт
Language:
Russian
Keywords:
heavy charged particles, single events, integrated circuits, stability, degree of integration, scaling effect
Abstract and keywords
Abstract (English):
The article considers the influence of scaling effects on the stability of integrated circuits (IC) under the influence of cosmic particles. There are two directions of scaling: reduction of topological dimensions of IC elements and optimization of energy consumption due to design and technological solutions. The paper analyzes the main effects (SEU, SEL, SEHE, SEGR and MBU) on the sensitivity of the IC to single events (SE)

Keywords:
heavy charged particles, single events, integrated circuits, stability, degree of integration, scaling effect
References

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