Russian Federation
Voronezh, Russian Federation
AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"
Russian Federation
The article considers a model for evaluating the reliability of integrated circuits (IC) depending on the temperature of the crystal and the environment. The calculation and experimental prediction of the reliability of the 1921VK028 chips was carried out, the dependences of the minimum time to failure of the product on the temperature of the 1921VK028 IC crystal and the gamma-percent life of the IC on the ambient temperature were obtained. The obtained values of these chip parameters meet the requirements of ISO 11 0998-99
integrated circuits, 1921VK028, reliability, reliability, gamma-percent shelf life
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