%0 Journal Article
%T RESULTS OF RELIABILITY EVALUATION OF THE 1921VK028 CHIP
%A Zolnikov, V.K.
%A Evdokimova, S.A.
%A Grosheva, E.V.
%A Yankov, A.I.
%K integrated circuits, 1921VK028, reliability, reliability, gamma-percent shelf life
%J Modeling of systems and processes
%D 2020
%N 12
%P 4
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov