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RESULTS OF STUDIES OF ULTRAFAST RECTIFIER DIODES UNDER THE INFLUENCE OF RADIATION
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RESULTS OF STUDIES OF ULTRAFAST RECTIFIER DIODES UNDER THE INFLUENCE OF RADIATION
UDK 62 Инженерное дело. Техника в целом. Транспорт
Zolnikov V. 1
Yankov A. Il'ich 2
Kulay A. 3
Savchenko Andrey 4
Yagodkin A. Sergeevich 5
Antsiferova V. 6
Evdokimova Svetlana Anatol'evna 7
Skvortsova Tatyana Vladimirovna 8
Maklakova Elena 9
Ilunina Anna Aleksandrovna 10
Kvasov Oleg Nikolaevich 11
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  LLC «SPE Detector»

Russian Federation
3.  AO «Nauchno-issledovatel'skiy institut elektronnoy tehniki»

4.  AO «Nauchno-issledovatel'skiy institut mikropriborov» (g. Moskva)

5.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
6.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
7.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
8.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
9.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
10.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
11.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Type:
Article
DOI:
https://doi.org/10.12737/2219-0767-2019-12-3-42-47
Pages:
from 42 to 47
Status:
Published
Received:
01.12.2019
Accepted:
01.12.2019
Published:
01.12.2019
Subject area:
UDK 62 Инженерное дело. Техника в целом. Транспорт
Language:
Russian
Keywords:
ultrafast rectifier diodes, radiation, durability, radioelectronics, CMOS technology, time of loss of efficiency
Abstract and keywords
Abstract (English):
The article presents the results of studies of ultrafast rectifier diodes intended for use in high-frequency rectifiers, modulators, converters, pulse transducers, limiters and other pulse devices under the influence of radiation. The schemes of measuring the current and voltage of diodes under the influence of special factors are given

Keywords:
ultrafast rectifier diodes, radiation, durability, radioelectronics, CMOS technology, time of loss of efficiency
References

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