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PRACTICAL METHODS OF CHIP DESIGN VERIFICATION
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PRACTICAL METHODS OF CHIP DESIGN VERIFICATION
UDK 60 Прикладные науки. Общие вопросы
Zolnikov V. 1
Evdokimova Svetlana Anatol'evna 2
Skvortsova Tatyana Vladimirovna 3
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
3.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
Type:
Article
DOI:
https://doi.org/10.12737/article_5d639c80d03ac5.18926339
Pages:
from 25 to 30
Status:
Published
Received:
22.08.2019
Accepted:
26.08.2019
Published:
26.08.2019
Subject area:
UDK 60 Прикладные науки. Общие вопросы
Language:
Russian
Keywords:
Mikroshema, proektirovanie, verifikaciya «sverhu vniz», verifikaciya «snizu vverh», verifikaciya na osnove apparatnoy platforme, verifikaciya na osnove sistemnogo interfeysa.
Abstract and keywords
Abstract (English):
V stat'e rassmatrivayutsya sovremennye metodiki verifikacii proektirovaniya mikroshem: «sverhu vniz», «snizu vverh», na osnove apparatnoy platforme i na osnove sistemnogo interfeysa. Predstavleny shemy privedennyh vyshe metodik proektirovaniya i verifikacii. Dlya ocenki kachestva vypolnennoy verifikacii celesoobrazno razrabotat' ee plan, kotoryy budet opisyvat' neobhodimye resursy i parametry ocenki kachestva provedennyh procedur.

Keywords:
Mikroshema, proektirovanie, verifikaciya «sverhu vniz», verifikaciya «snizu vverh», verifikaciya na osnove apparatnoy platforme, verifikaciya na osnove sistemnogo interfeysa.
References

1. Zol'nikov, V.K. Metodika proektirovaniya sovremennoy mikrokomponentnoy bazy s uchetom odinochnyh sobytiy radiacionnogo vozdeystviya / V.K. Zol'nikov // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2012. - № 3. - S. 5-8.

2. Sovmeschennaya apparatno-programmnaya verifikaciya mikroshem / V.A. Sklyar, K.V. Zol'nikov, I.V. Nagornyy // Modelirovanie sistem i processov. - 2012. - № 2. - S. 63-65.

3. Metody shemotehnicheskogo modelirovaniya KMOP SBIS s uchetom radiacii / K.V. Zol'nikov, V.A. Sklyar, V.I. Anciferova, S.A. Evdokimova // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2014. - № 2. - S. 5-9.

4. Zol'nikov, V.K. Metodika proektirovaniya radiacionno-stoykih integral'nyh shem / V.K. Zol'nikov, V.N. Achkasov, V.P. Kryukov // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2004. - № 1-2. - S. 57-60.

5. Sozdanie shemotehnicheskogo i konstruktivno-tehnologicheskogo bazisa mikroshem special'nogo naznacheniya / V.K. Zol'nikov, V.P. Kryukov, A.Yu. Kulay, Yu.K. Fortinskiy, I.I. Strukov, M.V. Solodilov // Modelirovanie sistem i processov. - 2017. - T. 10, № 1. - S. 27-29.

6. Sklyar, V.A. Proektirovanie i ispytaniya mikroshem dlya sistem sbora i obrabotki informacii / V.A. Sklyar, A.V. Achkasov, K.V. Zol'nikov // Radiotehnika. - 2014. - № 6. - S. 94-98.

7. Raschet izmeneniya shemotehnicheskih parametrov pri vozdeystvii nizkointensivnogo izlucheniya faktorov kosmicheskogo prostranstva/ K.V. Zol'nikov, V.A. Sklyar, V.P. Kryukov, A.S. Groshev, K.A. Chubur // Modelirovanie sistem i processov. - 2015. - T. 8, № 3. - S. 33-35.

8. Metody obespecheniya stoykosti mikroshem k odinochnym sobytiyam pri proektirovanii radiacionno-stoykih mikroshem / V.N. Achkasov, V.A. Smerek, D.M. Utkin, V.K. Zol'nikov // Problemy razrabotki perspektivnyh mikro- i nanoelektronnyh sistem (MES). - 2012. - № 1. - S. 634-637.

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