Moskva, Russian Federation
Introduction. High demands on the quality of aviation technology products require strict regulation of all technological operations, including non-destructive testing. Radiographic inspection with image acquisition on a radiographic film (RF) is widely used. The quality of the resulting image depends on the type of film used at inspection. According to the international standards ISO11699-1:2008 and ISO11699-2:2008, properties of RFs are distributed into six classes. The use of RF of a particular class is strictly regulated. For example, the RF of class C5 cannot be used for inspection of critical aviation technology products. Russian RFs are not classified according to the abovementioned standards. The purpose of this work was to develop a procedure for RF class determination. Method. VIAM specialists have developed and offer the technique, which enables the class and quality level of RF to be determined. The specially designed samples are necessary to carry out the technique. The samples are simple and can be made at any enterprise and of any material. Description and photographs of the samples as well as test modes and radiographs processing algorithm are presented in the article. The technique recommends that the samples be exposed at several values of anode voltage within the range of 20-300 kV. This will give the information about how RF properties depend on the radiation energy. Results. It is shown that the experimentally obtained optical density dependences on the absorber layer thickness up to a constant correspond to the film characteristic curve obtained with a sensitometer and a clinical dosimeter. The quality of sample images makes it possible to estimate the testing optimal mode and sensitivity. Conclusion. The offered technique corresponds to the test methods stated in ISO11699-2:2008, however film gradient evaluation fulfilled according to the offered technique is more reliable because it does not exclude the film spectrum. The technique allows film radiation sensitivity and other parameters to be determined using the obtained anode voltage dependence instead of the film characteristic curve. The versatility of the technique and possibility of its extending to other industries objects inspection is shown.
X-ray film, sensitometric characteristics, radiation sensitivity, normal gradient, resolution limit, characteristic curve
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