DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE
Abstract and keywords
Abstract (English):
This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.

Keywords:
microcontroller, ultra-large integrated circuit (VLSI), VLSI fault tolerance, ion-izing radiation, radiation resistance
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References

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