Printed circuit boards with microstrip transmission lines are increasingly used in microwave technology, oppressing the classic feeder paths, such as waveguides of various shapes. Reliable information on the parameters of dielectric substrate materials is one of the key factors in ensuring the performance of the developed microstrip microwave devices. This article describes the known S3-method of measuring the dielectric parameters of printed circuit Board materials and examples of its application to measure the parameters of various dielectric materials. The paper presents the structure and description of the measuring stand and the principles of the development of measuring cells. The examples of the developed topologies of the measuring cells and the results of measuring of parameters of materials.
Microwave printed circuit Board, measurement of dielectric parameters



