SENSITIVITY ANALYSIS AND TEST RESULTS OF THE ELECTRONIC COMPONENT BASE TO THE EFFECTS OF HEAVY CHARGED PARTICLES
Abstract and keywords
Abstract (English):
The work is devoted to the study of the sensitivity of the electronic component base (ECB) to the effects of heavy charged particles. At the same time, the degree of sensitivity is distinguished depending on the functional group of ECB products to the effects of ionization radiation from outer space and on the design and technological design of ECB products. The paper presents the characteristics and conditions for the use of ECB in the radio-electronic equipment of outer space to ensure minimal sensitivity to the effects of ionization radiation and to the thyristor effect. After the sensitivity analysis of ECB products is carried out, a preliminary selection of ECB is performed, requiring testing. The article discusses the criteria for determining the ECB that requires testing and is possible to use without testing. The methods of increasing the durability of radio-electronic equipment of space equipment and the directions of optimization of the methodology of analysis of ECB lists are determined.

Keywords:
Electronic component base (ECB), heavy charged particles (HCP), ionization radiation (IR), outer space (OS), tests, radiation resistance
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