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RESULTS OF RELIABILITY EVALUATION OF THE 1921VK035 CHIP
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RESULTS OF RELIABILITY EVALUATION OF THE 1921VK035 CHIP
UDK 62 Инженерное дело. Техника в целом. Транспорт
Zolnikov V. 1
Evdokimova Svetlana Anatol'evna 2
Grosheva Ekaterina Vladimirovna 3
Yankov A. Il'ich 4
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
3.  AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

4.  LLC «SPE Detector»

Russian Federation
Type:
Article
DOI:
https://doi.org/10.12737/2219-0767-2020-12-4-42-46
Pages:
from 42 to 46
Status:
Published
Received:
23.01.2020
Accepted:
23.01.2020
Published:
23.01.2020
Subject area:
UDK 62 Инженерное дело. Техника в целом. Транспорт
Language:
Russian
Keywords:
integrated circuits, 1921VK035, reliability, reliability, gamma-percent shelf life
Abstract and keywords
Abstract (English):
The article considers a model for evaluating the reliability of integrated circuits (IC) depending on the temperature of the crystal and the environment. The calculation and experimental prediction of the reliability of the 1921VK035 chips was carried out, the dependences of the minimum time to failure of the product on the temperature of the 1921VK035 IC crystal and the gamma-percent life of the IC on the ambient temperature were obtained. The obtained values of these chip parameters meet the requirements of ISO 11 0998-99.

Keywords:
integrated circuits, 1921VK035, reliability, reliability, gamma-percent shelf life
References

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