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METHODS OF VERIFICATION OF COMPLEX FUNCTIONAL BLOCKS IN CAD FOR CHIPS OF DEEP SUBMICRON DESIGN NORMS
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METHODS OF VERIFICATION OF COMPLEX FUNCTIONAL BLOCKS IN CAD FOR CHIPS OF DEEP SUBMICRON DESIGN NORMS
UDK 60 Прикладные науки. Общие вопросы
Zolnikov V. 1
Evdokimova Svetlana Anatol'evna 2
Skvortsova Tatyana Vladimirovna 3
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
3.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
Type:
Article
DOI:
https://doi.org/10.12737/article_5d639c80c83b71.60273345
Pages:
from 16 to 24
Status:
Published
Received:
22.08.2019
Accepted:
26.08.2019
Published:
26.08.2019
Subject area:
UDK 60 Прикладные науки. Общие вопросы
Language:
Russian
Keywords:
Mikroshema, slozhno-funkcional'nyy blok (SF-blok), sistema avtomatizirovannogo proektirovaniya (SAPR), verifikaciya, sistemy na kristalle, mikroshemy cifrovoy obrabotki signalov (COS).
Abstract and keywords
Abstract (English):
V stat'e rassmatrivayutsya etapy proektirovaniya sverhbol'shih integral'nyh shem (SBIS) i osobennosti procedury verifikacii slozhno-funkcional'nyh blokov SBIS. Proanalizirovany osnovnye podhody k proceduram verifikacii mikroshem dlya minimizacii dlitel'nosti verifikacionnyh ciklov. Na praktike obychno ispol'zuetsya kombinaciya iz neskol'kih podhodov k verifikacii.

Keywords:
Mikroshema, slozhno-funkcional'nyy blok (SF-blok), sistema avtomatizirovannogo proektirovaniya (SAPR), verifikaciya, sistemy na kristalle, mikroshemy cifrovoy obrabotki signalov (COS).
References

1. Metody shemotehnicheskogo modelirovaniya KMOP SBIS s uchetom radiacii / K.V. Zol'nikov, V.A. Sklyar, V.I. Anciferova, S.A. Evdokimova // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2014. - № 2. - S. 5-9.

2. Proektirovanie i ispytaniya mikroshem dlya sistem sbora i obrabotki informacii / V.A. Sklyar, A.V. Achkasov, K.V. Zol'nikov // Radiotehnika. - 2014. - № 6. - S. 94-98.

3. Achkasov, A.V. Sozdanie otechestvennoy proektnoy sredy razrabotki mikroelektronnyh sistem / A.V. Achkasov, A.I. Yan'kov // Privodnaya tehnika. - 2006. - № 5. - S. 28-30.

4. Osnovnye metody i procedury verifikacii SF-blokov / V.A. Sklyar, V.P. Kryukov, V.N. Achkasov, Yu.A. Chevychelov // Modelirovanie sistem i processov. - 2011. - № 4. - S. 58-61.

5. Opredelenie veroyatnosti bezotkaznoy raboty pri strukturnoy optimizacii elementov slozhnyh funkcional'nyh blokov v SAPR / V.A. Smerek, K.V. Zol'nikov, A.I. Yan'kov, M.V. Konarev, N.A. Orlikovskiy, A.V. Achkasov // Modelirovanie sistem i processov. - 2013. - № 3. - S. 35-37.

6. Problema celostnosti signala: harakterizaciya i modelirovanie processov v SAPR / V.A. Sklyar, V.K. Zol'nikov, A.I. Yan'kov, Yu.A. Chevychelov, V.F. Barabanov // Modelirovanie sistem i processov. - 2013. - № 2. - S. 67-72.

7. Fortinskiy, Yu. K. Sozdanie podsistemy verifikacii slozhnyh cifrovyh mikroshem s uchetom radiacionnogo vozdeystviya / Yu.K. Fortinskiy, V.K. Zol'nikov, M.V. Konarev. - Voronezh, 2011. - 121 s.

8. Metody obespecheniya stoykosti mikroshem k odinochnym sobytiyam pri proektirovanii radiacionno-stoykih mikroshem / V.N. Achkasov, V.A. Smerek, D.M. Utkin, V.K. Zol'nikov // Problemy razrabotki perspektivnyh mikro- i nanoelektronnyh sistem (MES). -2012. - № 1. - S. 634-637.

9. Kryukov, V.P. Problemy modelirovaniya bazovyh elementov KMOP BIS dvoynogo naznacheniya v SAPR / V.P. Kryukov, K.V. Zol'nikov, S.A. Evdokimova // Modelirovanie sistem i processov. - 2013. - № 4. - S. 41-44.

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