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ANALYSIS OF THE PROBLEMS OF MODELING ELEMENTS OF CMOS LSI
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ANALYSIS OF THE PROBLEMS OF MODELING ELEMENTS OF CMOS LSI
UDK 60 Прикладные науки. Общие вопросы
Zolnikov V. 1
Evdokimova Svetlana Anatol'evna 2
Fomichev Aleksandr Vital'evich 3
Chikin Vitaliy Nikolaevich 4
Achkasov A. Vladimirovich 5
Zinchenko V. F. 6
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
3.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
4.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
5.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
6.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
Type:
Article
DOI:
https://doi.org/10.12737/article_5c79642bd56f27.90584496
Pages:
from 20 to 25
Status:
Published
Received:
01.03.2019
Accepted:
01.03.2019
Published:
01.03.2019
Subject area:
UDK 60 Прикладные науки. Общие вопросы
Language:
Russian
Keywords:
KMOP BIS, SAPR, mikroshema, tehnologii proektirovaniya, modelirovanie neispravnostey, biblioteka tipovyh elementov.
Abstract and keywords
Abstract (English):
V stat'e rassmatrivayutsya sovremennye tehnologii proektirovaniya KMOP BIS i analiziruyutsya problemy, kotorye voznikayut v processe modelirovaniya BIS na razlichnyh ierarhicheskih urovnyah processa proektirovaniya. Provedennyy analiz pokazal, chto aktual'noy zadachey yavlyaetsya razvitie programmnyh sredstv modelirovaniya neispravnostey s minimizaciey vychislitel'nyh zatrat.

Keywords:
KMOP BIS, SAPR, mikroshema, tehnologii proektirovaniya, modelirovanie neispravnostey, biblioteka tipovyh elementov.
References

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10. Razrabotka sredstv avtomatizacii proektirovaniya specializirovannyh mikroshem dlya upravlyayuschih vychislitel'nyh kompleksov dvoynogo naznacheniya : monografiya / V. N. Achkasov, V.M. Antimirov, V.E. Mezhov, V.K. Zol'nikov. - Voronezh, 2005. - 240 s.

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14. Zol'nikov, V.K. Proektirovanie mikroshem s uchetom radiacionnogo vozdeystviya / V. K. Zol'nikov, V. P. Kryukov, A. I. Yan'kov // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2009. -№2. - S. 28-30.

15. Modelirovanie ionizacionnyh effektov i effektov smescheniya v cifrovyh mikroshemah dlya SAPR / V. K. Zol'nikov, V. V. Lavlinskiy, Yu. A. Chevychelov, Yu. S. Serbulov, V. I. Anciferova, V.N. Achkasov, Yu.G. Tabakov // Lesotehnicheskiy zhurnal. - 2014. - T. 4, № 4 (16). - S. 280-291.

16. Chevychelov, Yu. A. Raschet i analiz stoykosti KMOP-komponentov IS v strukture SAPR SBIS / Yu. A. Chevychelov // Politematicheskiy setevoy elektronnyy nauchnyy zhurnal Kubanskogo gosudarstvennogo agrarnogo universiteta. - 2012. - № 77. - S. 214-224.

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