DETERMINATION OF THICKNESS OF A SILVER COVERING ON FINNED WALLS BY THE X-RAY FLUORESCENT ANALYSIS METHOD
Abstract and keywords
Abstract (English):
stenkah metodom rentgenofluorescentnogo analiza Otrabotana metodika opredeleniya tolschiny gal'vanicheskogo serebryanogo pokrytiya, nanesennogo na orebrennuyu bronzovuyu stenku, metodom rentgenofluorescentnogo analiza i poluchena zavisimost' tolschiny pokrytiya ot koncentracii serebra. Opredelena kriticheskaya tolschina pokrytiya — granica primenimosti metoda. Provedena eksperimental'naya proverka metodiki putem opredeleniya tolschiny pokrytiya na orebrennyh stenkah tovarnyh prostavok.

Keywords:
rentgenofluorescentnyy analiz, harakteristicheskoe izluchenie, orebrennaya stenka, gal'vanicheskoe pokrytie, kriticheskaya tolschina pokrytiya
References

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