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 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">NDT World</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">NDT World</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>В мире неразрушающего контроля</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">1609-3178</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">33583</article-id>
   <article-id pub-id-type="doi">10.12737/article_5dcbf2c26201f1.85365726</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>НК в США</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject>NDT in USA</subject>
    </subj-group>
    <subj-group>
     <subject>НК в США</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">Nondestructive Testing of Dielectric Materials using an Active Reflecting Microwave Array</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Неразрушающий контроль диэлектрических материалов с использованием активной отражающей микроволновой антенной решётки</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Тейеби</surname>
       <given-names>Амин </given-names>
      </name>
      <name xml:lang="en">
       <surname>Tayebi</surname>
       <given-names>Amin </given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Чахал</surname>
       <given-names>Премджит </given-names>
      </name>
      <name xml:lang="en">
       <surname>Chahal</surname>
       <given-names>Premjeet </given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-2"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Удпа</surname>
       <given-names>Лалита </given-names>
      </name>
      <name xml:lang="en">
       <surname>Udpa</surname>
       <given-names>Lalita </given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-3"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Удпа</surname>
       <given-names>Сатиш С. </given-names>
      </name>
      <name xml:lang="en">
       <surname>Udpa</surname>
       <given-names>Satish S. </given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-4"/>
    </contrib>
   </contrib-group>
   <aff-alternatives id="aff-1">
    <aff>
     <institution xml:lang="ru">Университет штата Мичиган</institution>
     <city>Мичиган</city>
     <country>США</country>
    </aff>
    <aff>
     <institution xml:lang="en">Michigan State University</institution>
     <city>Michigan</city>
     <country>United States of America</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-2">
    <aff>
     <institution xml:lang="ru">Университет штата Мичиган</institution>
     <city>Мичиган</city>
     <country>США</country>
    </aff>
    <aff>
     <institution xml:lang="en">Michigan State University</institution>
     <city>Michigan</city>
     <country>United States of America</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-3">
    <aff>
     <institution xml:lang="ru">Университет штата Мичиган</institution>
     <city>Мичиган</city>
     <country>США</country>
    </aff>
    <aff>
     <institution xml:lang="en">Michigan State University</institution>
     <city>Michigan</city>
     <country>United States of America</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-4">
    <aff>
     <institution xml:lang="ru">Университет штата Мичиган</institution>
     <city>Мичиган</city>
     <country>США</country>
    </aff>
    <aff>
     <institution xml:lang="en">Michigan State University</institution>
     <city>Michigan</city>
     <country>United States of America</country>
    </aff>
   </aff-alternatives>
   <volume>22</volume>
   <issue>4</issue>
   <fpage>12</fpage>
   <lpage>17</lpage>
   <self-uri xlink:href="https://naukaru.ru/en/nauka/article/33583/view">https://naukaru.ru/en/nauka/article/33583/view</self-uri>
   <abstract xml:lang="ru">
    <p>Микроволновой НК диэлектрических материалов в последнее время становится всё более востребованным. Диэлектрические композитные материалы предпочтительны по сравнению с металлическими аналогами благодаря их низкой плотности и высокой прочности. Экспоненциальный рост применения этих материалов в современном машиностроении обуславливает необходимость создания эффективных средств их НК. В статье представлена новая микроволновая система формирования изображения для неразрушающей дефектоскопии диэлектрических материалов. Система использует активную фазированную антенную решётку с углом сканирования 150°, в пределах которого размещаются диэлектрические объекты контроля. Поле рассеяния микроволн, измеренное под разными углами сектора сканирования, использовалось для компьютерной реконструкции изображения и обнаружения дефектов с применением метода обращения времени. В статье рассматриваются два типа дефектов: воздушные полости и металлические включения. Представлены экспериментальные результаты микроволнового обнаружения этих дефектов в диэлектрических образцах.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>Microwave testing of dielectric materials has recently become an increasingly important field. Dielectric materials such as composites are preferred over metallic counterparts, due to their light weight and superior strength. Because of the exponential growth in the use of such materials, a reliable method for testing is vital. This paper presents a novel microwave imaging system for the nondestructive detection of anomalies in dielectric materials. The system utilizes an active beam steering array that scans a wide circular sector of 150° where dielectric targets are positioned. The scattered field, measured on the arc of the sector, was used for image reconstruction and discontinuity detection by means of time reversal signal processing. Two types of anomalies are considered in the paper: discontinuities and metallic impurities. Experimental results of detecting these anomalies within dielectric samples are presented.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>радиоволновой контроль</kwd>
    <kwd>СВЧ метод</kwd>
    <kwd>управление лучом</kwd>
    <kwd>метод обращения времени</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>microwave testing</kwd>
    <kwd>microwave imaging</kwd>
    <kwd>antenna arrays</kwd>
    <kwd>beam steering</kwd>
    <kwd>time reversal signal processing</kwd>
   </kwd-group>
  </article-meta>
 </front>
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