00927naa#a2200193#i#4500001001500000005001700015011001400032100004100046102000700087200018400094210013700278215001000415608002700425675018300452700003300635700001800668700003200686856001500718EN\\bibl\8916820241204123027.3##a2219-0767##a20241023b2024####ek#y0engy0150####ca##aRU1#aOptimization of test methods and algorithms for assessing the resistance of field-effect transistors to various types of radiation using promising test equipmenteJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2024##a9 с.##aJournal article2local##aЭлектроника. Фотоэлектроника. Электронные лампы, трубки. Рентгенотехника. Ускорители частиц. 621.38#1aVatuevgAlexaendr Sergeevich#1aSharapovgA A#1aOzerovgAlexander Ivanovich4#anaukaru.ru