LDR 00927naa#a2200193#i#450#
001     EN\\bibl\89168
005     20250402023047.3
011 ## _a2219-0767
100 ## _a20241023b2024####ek#y0engy0150####ca
102 ## _aRU
200 1# _aOptimization of test methods and algorithms for assessing the resistance of field-effect transistors to various types of  radiation using promising test equipment
       _eJournal article
210 1# _aVoronezh
       _cFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
       _d2024
215 ## _a9 с.
608 ## _aJournal article
       _2local
675 ## _aЭлектроника. Фотоэлектроника. Электронные лампы, трубки. Рентгенотехника. Ускорители частиц. 621.38
       _z
700 #1 _aVatuev
       _gAlexaendr Sergeevich
700 #1 _aSharapov
       _gA A
700 #1 _aOzerov
       _gAlexander Ivanovich
856 4# _anaukaru.ru
       _u