00878naa#a2200193#i#450# EN\\bibl\53299 20240605153750.3 2219-0767 20221005b2022####ek#y0engy0150####ca RU Evaluation of the effect of crystal structural features on the resistance of DMOS transistors to ionizing radiation Journal article Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2022 8 с. Journal article local Электронные элементы, использующие свойства твердого тела. Полупроводниковая электроника. 621.382 Kharchenko M. Eduardovich Dorohov V. A. Kolesnikov Maksim Ivanovich naukaru.ru