00761naa#a2200205#i#450# EN\\bibl\10304 20240804075149.7 2219-0767 20160111b2016####ek#y0engy0150####ca RUS RU THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES Journal article Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2016 2 с. Journal article local Achkasov A. Vladimirovich Yankov A. Il'ich Zolnikov Konstantin Vladimirovich Chubur K. A. naukaru.ru