00761naa#a2200205#i#4500001001500000005001700015011001400032100004100046101000800087102000700095200015400102210013700256215001000393608002700403700003100430700002200461700003900483700001800522856001500540EN\\bibl\1030420240804071640.7##a2219-0767##a20160111b2016####ek#y0engy0150####ca0#aRUS##aRU1#aTHE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIESeJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2016##a2 с.##aJournal article2local#1aAchkasovgA. Vladimirovich#1aYankovgA. Il'ich#1aZolnikovgKonstantin Vladimirovich#1aChuburgK. A.4#anaukaru.ru