00770naa#a2200217#i#4500001001500000005001700015011001400032100004100046101000800087102000700095200015400102210013700256215001000393608002700403700001700430700001700447700001600464700003900480700001800519856001500537EN\\bibl\1030320241012161440.6##a2219-0767##a20160111b2016####ek#y0engy0150####ca0#aRUS##aRU1#aTHE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIESeJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2016##a2 с.##aJournal article2local#1aGroshevgA. #1aKryukovgV. #1aSklyargV. #1aZolnikovgKonstantin Vladimirovich#1aChuburgK. A.4#anaukaru.ru