LDR 00770naa#a2200217#i#450#
001     EN\\bibl\10303
005     20240804074349.7
011 ## _a2219-0767
100 ## _a20160111b2016####ek#y0engy0150####ca
101 0# _aRUS
102 ## _aRU
200 1# _aTHE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES
       _eJournal article
210 1# _aVoronezh
       _cFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
       _d2016
215 ## _a2 с.
608 ## _aJournal article
       _2local
700 #1 _aGroshev
       _gA. 
700 #1 _aKryukov
       _gV. 
700 #1 _aSklyar
       _gV. 
700 #1 _aZolnikov
       _gKonstantin Vladimirovich
700 #1 _aChubur
       _gK. A.
856 4# _anaukaru.ru
       _u