TY  CONF
TI  DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE
KW  microcontroller
KW  ultra-large integrated circuit (VLSI)
KW  VLSI fault tolerance
KW  ion-izing radiation
KW  radiation resistance
JO  Modern aspects of modeling systems and processes
AU  Zolnikov, K.V.
AU  Strukov, I.I.
AU  Chubur, K.A.
AU  Grechanyy, S.V.
AU  Yagodkin, A.S.
AU  Grosheva, E.V.
PY  2024
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov