%0 Conference Article
%T DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE
%A Zolnikov, K.V.
%A Strukov, I.I.
%A Chubur, K.A.
%A Grechanyy, S.V.
%A Yagodkin, A.S.
%A Grosheva, E.V.
%K microcontroller, ultra-large integrated circuit (VLSI), VLSI fault tolerance, ion-izing radiation, radiation resistance
%J Modern aspects of modeling systems and processes
%D 2024
%P 3
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov