%0 Journal Article
%T Optimization of test methods and algorithms for assessing the resistance of field-effect transistors to various types of  radiation using promising test equipment
%A Vatuev, A.S.
%A Sharapov, A.A.
%A Ozerov, A.I.
%K Field effect resistance, radiation exposure, test methods, SEB effect, transistor responses
%J Modeling of systems and processes
%D 2024
%N 17
%P 9
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov