TY  JOUR
TI  Causes of damage to the metallization of integrated circuits in terms of currents of high density
KW  damage
KW  failure
KW  metallization
KW  electrodiffusive
KW  reliability
KW  electrostatic discharge (ESD)
JO  Actual directions of scientific researches of the XXI century: theory and practice
AU  Vrabiy, E..
AU  Alekseev, V..
AU  Piskun, G..
AU  Degalevich, D..
PY  2015
IS  3
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov