%0 Journal Article
%T Causes of damage to the metallization of integrated circuits in terms of currents of high density
%A Vrabiy, E..
%A Alekseev, V..
%A Piskun, G..
%A Degalevich, D..
%K damage, failure, metallization, electrodiffusive, reliability, electrostatic discharge (ESD)
%J Actual directions of scientific researches of the XXI century: theory and practice
%D 2015
%N 3
%P 4
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov