%0 Journal Article
%T Modeling of processes in semiconductor structures under radiation exposure
%A Zolnikov, K.V.
%A Gamzatov, N.G.
%A Evdokimova, S.A.
%A Potapov, A.N.
%A Dopira, R.V.
%A Kucherov, Y.S.
%A Yanochkin, I.E.
%A Stoyanov, S..
%A Plotnikov, A.M.
%K Electronic component base, semiconductors, outer space radiation impact, oxide traps, process modeling
%J Modeling of systems and processes
%D 2022
%N 15
%P 9
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov