%0 Journal Article
%T Diagnostics of complex-functional ECB during radiation resistance tests
%A Yankov, A.I.
%K Electronic component base, VLSI, CMOS technology, radiation resistance, testing
%J Modeling of systems and processes
%D 2022
%N 15
%P 11
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov