TY  JOUR
TI  Evaluation of the effect of crystal structural features on the resistance of DMOS transistors to ionizing radiation
KW  Field effect transistors
KW  MOSFET
KW  DMOS
KW  MOS
KW  DMOS
KW  critical electric field strength
KW  resistance
KW  ionizing radiation
KW  CAD TCAD.
JO  Modeling of systems and processes
AU  Kharchenko, M.E.
AU  Dorohov, V.A.
AU  Kolesnikov, M.I.
PY  2022
IS  15
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov