%0 Journal Article
%T Evaluation of the effect of crystal structural features on the resistance of DMOS transistors to ionizing radiation
%A Kharchenko, M.E.
%A Dorohov, V.A.
%A Kolesnikov, M.I.
%K Field effect transistors, MOSFET, DMOS, MOS, DMOS, critical electric field strength, resistance, ionizing radiation, CAD TCAD.
%J Modeling of systems and processes
%D 2022
%N 15
%P 8
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov