%0 Journal Article
%T Circuit engineering methods for ensuring ECB resistance to the effects of heavy charged particles
%A Zolnikov, V.K.
%A Makarenko, F.V.
%A Zhuravleva, I.V.
%A Popova, E.A.
%A Gridnev, Y.V.
%A Litvinova, Y..
%K Electronic component base (ECB), heavy charged particles (HCP), durability, circuit engineering methods, fault tolerance, single events
%J Modeling of systems and processes
%D 2022
%N 14
%P 7
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov