TY  JOUR
TI  INCREASING THE RESISTANCE OF THE ELECTRONIC COMPONENT BASE TO THE DOSE EFFECTS OF RADIATION EXPOSURE
KW  electronic component base (ECB)
KW  radiation exposure
KW  dose effect
KW  microchips
KW  circuitry
KW  integrated circuits (IC)
KW  ionizing radiation
JO  Modeling of systems and processes
AU  Kozyukov, A.E.
AU  Zolnikov, K.V.
AU  Mescheryakov, S.G.
AU  Groshev, A.S.
AU  Sysoev, D..
PY  2021
IS  14
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov