%0 Journal Article
%T INCREASING THE RESISTANCE OF THE ELECTRONIC COMPONENT BASE TO THE DOSE EFFECTS OF RADIATION EXPOSURE
%A Kozyukov, A.E.
%A Zolnikov, K.V.
%A Mescheryakov, S.G.
%A Groshev, A.S.
%A Sysoev, D..
%K electronic component base (ECB), radiation exposure, dose effect, microchips, circuitry, integrated circuits (IC), ionizing radiation
%J Modeling of systems and processes
%D 2021
%N 14
%P 6
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov