TY  JOUR
TI  TO THE QUESTION OF RELIABILITY OF  MODERN DIGITAL STORAGE DEVICES
KW  reliability of microcircuits
KW  complexity of digital devices
KW  memory size
KW  number of failures
KW  integrated circuits
KW  external factors.
JO  Voronezh Scientific-Technical Bulletin
AU  Gridneva, I.V.
AU  Kamalov, N.R.
AU  Gridnev, A.S.
PY  2020
IS  3
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov