%0 Journal Article
%T TO THE QUESTION OF RELIABILITY OF  MODERN DIGITAL STORAGE DEVICES
%A Gridneva, I.V.
%A Kamalov, N.R.
%A Gridnev, A.S.
%K reliability of microcircuits, complexity of digital devices, memory size, number of failures, integrated circuits, external factors.
%J Voronezh Scientific-Technical Bulletin
%D 2020
%N 3
%P 4
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov