%0 Journal Article
%T THE RESULTS OF THE TESTING OF COMPLEX CHIPS TO THE IMPACT OF HEAVY CHARGED PARTICLES
%A Yankov, A.I.
%A Meerson, V.E.
%A Zolnikov, K.V.
%A Kryukov, V..
%K irradiation of the samples ERIE, thyristor effect, failure events switching events of a single functional failures.
%J Modeling of systems and processes
%D 2016
%N 9
%P 2
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov