TY  JOUR
TI  THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES
KW  design automation
KW  heavy charged particles
KW  radiation
KW  chip.
JO  Modeling of systems and processes
AU  Achkasov, A.V.
AU  Yankov, A.I.
AU  Zolnikov, K.V.
AU  Chubur, K.A.
PY  2016
IS  8
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov