%0 Journal Article
%T THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES
%A Achkasov, A.V.
%A Yankov, A.I.
%A Zolnikov, K.V.
%A Chubur, K.A.
%K design automation, heavy charged particles, radiation, chip.
%J Modeling of systems and processes
%D 2016
%N 8
%P 2
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov