TY  JOUR
TI  THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES
KW  computer-aided design
KW  radiation
KW  chip.
JO  Modeling of systems and processes
AU  Groshev, A..
AU  Kryukov, V..
AU  Sklyar, V..
AU  Zolnikov, K.V.
AU  Chubur, K.A.
PY  2016
IS  8
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov