%0 Journal Article
%T THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES
%A Groshev, A..
%A Kryukov, V..
%A Sklyar, V..
%A Zolnikov, K.V.
%A Chubur, K.A.
%K computer-aided design, radiation, chip.
%J Modeling of systems and processes
%D 2016
%N 8
%P 2
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov