@article{Groshev2016the,
author={Groshev, A.. and Kryukov, V.. and Sklyar, V.. and Zolnikov, K.V. and Chubur, K.A.},
title={THE ALGORITHMIC BASIS OF MODELLING OF FAILURES FROM EXPOSURE TO HEAVY CHARGED PARTICLES IN VLSI, MADE BY DEEP-SUBMICRON TECHNOLOGIES},
journal={Modeling of systems and processes},
publisher={FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov},
year={2016},
pages={33-35},
volume={8},
issue={3},
}