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 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">Automation and modeling in design and management</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">Automation and modeling in design and management</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Автоматизация и моделирование в проектировании и управлении</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">2658-3488</issn>
   <issn publication-format="online">2658-6436</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">51179</article-id>
   <article-id pub-id-type="doi">10.30987/2658-6436-2022-2-92-100</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>Электротехнические комплексы и системы</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject>Electrotechnical complexes and systems</subject>
    </subj-group>
    <subj-group>
     <subject>Электротехнические комплексы и системы</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">MODELING POWER CHARACTERISTICS OF SCHOTTKY DIODE UNDER EXTREME OPERATION MODES</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>МОДЕЛИРОВАНИЕ ХАРАКТЕРИСТИК СИЛОВОГО ДИОДА ШОТТКИ В ЭКСТРЕМАЛЬНЫХ РЕЖИМАХ ЭКСПЛУАТАЦИИ</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Малаханов</surname>
       <given-names>Алексей Алексеевич</given-names>
      </name>
      <name xml:lang="en">
       <surname>Malakhanov</surname>
       <given-names>Alexey Alexeevich</given-names>
      </name>
     </name-alternatives>
     <email>malakhan@yandex.ru</email>
     <bio xml:lang="ru">
      <p>кандидат технических наук;</p>
     </bio>
     <bio xml:lang="en">
      <p>candidate of technical sciences;</p>
     </bio>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Медведев</surname>
       <given-names>Дмитрий Михайлович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Medvedev</surname>
       <given-names>Dmitriy Mihailovich</given-names>
      </name>
     </name-alternatives>
     <email>atsys@tu-bryansk.ru</email>
     <bio xml:lang="ru">
      <p>кандидат технических наук;</p>
     </bio>
     <bio xml:lang="en">
      <p>candidate of technical sciences;</p>
     </bio>
     <xref ref-type="aff" rid="aff-2"/>
    </contrib>
   </contrib-group>
   <aff-alternatives id="aff-1">
    <aff>
     <institution xml:lang="ru">Брянский государственный технический университет</institution>
     <city>Брянск</city>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Bryansk State Technical University</institution>
     <city>Bryansk</city>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-2">
    <aff>
     <institution xml:lang="ru">Брянский государственный технический университет</institution>
    </aff>
    <aff>
     <institution xml:lang="en">Bryansk State Technical University</institution>
    </aff>
   </aff-alternatives>
   <pub-date publication-format="print" date-type="pub" iso-8601-date="2022-06-30T14:34:52+03:00">
    <day>30</day>
    <month>06</month>
    <year>2022</year>
   </pub-date>
   <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2022-06-30T14:34:52+03:00">
    <day>30</day>
    <month>06</month>
    <year>2022</year>
   </pub-date>
   <volume>2022</volume>
   <issue>2</issue>
   <fpage>92</fpage>
   <lpage>100</lpage>
   <history>
    <date date-type="received" iso-8601-date="2022-06-22T00:00:00+03:00">
     <day>22</day>
     <month>06</month>
     <year>2022</year>
    </date>
   </history>
   <self-uri xlink:href="https://naukaru.ru/en/nauka/article/51179/view">https://naukaru.ru/en/nauka/article/51179/view</self-uri>
   <abstract xml:lang="ru">
    <p>Представлены результаты приборно-технологического моделирования статических вольтамперных характеристик (ВАХ), а также зависимостей дифференциального сопротивления и рассеиваемой мощности для структуры карбидокремниевого диода Шоттки в САПР Synopsys Sentaurus TCAD. В результате исследований и моделирования подобраны конструктивно-технологические параметры диода Шоттки, на основе которых получены ВАХ, сопоставимые с заданной точностью с физическим экспериментом (ток анода не менее 100 А, пробивное напряжение не менее 1400 В при температуре 77 К). Выполнена верификация полученных приборно-технологическим моделированием статических характеристик диода Шоттки путем сопоставления результатов вычислительного эксперимента с физическим исследованием диода C4D20120D фирмы Cree для диапазона температур от 300 К до 77 К. Новизна работы заключается: в разработке приборно-технологической модели (ПТМ) полупроводникового прибора, учитывающей эффект саморазогрева кристалла; получении результатов, отражающих характеристики полупроводникового прибора в нормальных и экстремальных температурных режимах эксплуатации; получении зависимостей, отражающих изменение дифференциального сопротивления и рассеиваемую мощность; возможности использования результатов разработанной ПТМ для промышленной реализации карбидокремниевого диода Шоттки на предприятиях России в виде дискретных полупроводниковых приборов, либо элементов в составе полупроводниковых силовых модулей.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>The results of device-technological modelling of static current-voltage characteristics (CVC), as well as the dependences of differential resistance and power dissipation for the structure of a silicon carbide Schottky diode in Synopsys Sentaurus TCAD are presented. As a result of the research and modelling, the design and technological parameters of the Schottky diode are selected, on the basis of which the current-voltage characteristics are obtained, comparable with the specified accuracy with the physical experiment (the anode current is not less than 100 A, the breakdown voltage is not less than 1400 V at a temperature of 77 K). Verifying the static characteristics of the Schottky diode obtained by the instrumental-technological modelling is carried out by comparing the results of a computational experiment with a physical study of the Cree C4D20120D diode for a temperature range from 300 K to 77 K. The novelty of the work lies in developing an instrument-technological model (ITM) of a semiconductor device that takes into consideration a crystal self-heating effect; obtaining results reflecting the characteristics of a semiconductor device in the normal and extreme temperature operating conditions; in obtaining dependences reflecting the change in differential resistance and power dissipation; in having the possibility to use the results of the developed ITM for the industrial implementation of the silicon carbide Schottky diode at Russian enterprises in the form of discrete semiconductor devices, or elements as part of semiconductor power modules.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>диод Шоттки</kwd>
    <kwd>жидкий азот</kwd>
    <kwd>приборно-технологическая модель</kwd>
    <kwd>TCAD</kwd>
    <kwd>статические характеристики</kwd>
    <kwd>конструктивно-технологическое решение</kwd>
    <kwd>карбид кремния</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>Schottky diode</kwd>
    <kwd>liquid nitrogen</kwd>
    <kwd>instrument-technological model</kwd>
    <kwd>TCAD</kwd>
    <kwd>static characteristics</kwd>
    <kwd>constructive-technological solution</kwd>
    <kwd>silicon carbide</kwd>
   </kwd-group>
   <funding-group>
    <funding-statement xml:lang="ru">работа выполнена при поддержке Фонда перспективных исследований, договор №6/211/2021ав от 25.02.2021.</funding-statement>
    <funding-statement xml:lang="en">the work was carried out with the support of the Foundation for Advanced Research, Contract No. 6/211/2021av dated 02/25/2021.</funding-statement>
   </funding-group>
  </article-meta>
 </front>
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