ANALYSIS OF POTENTIAL ECB EFFECTS FROM AI CP EXPOSURE
Abstract and keywords
Abstract (English):
The nature of the effect of radiation on a solid depends on the type, kinetic energy, mass and charge of the particles that make up this radiation, as well as on the mass, atomic number and density of the material. The article deals with the issues related to the physical models of the impact of ionizing radiation from outer space on the components of spacecraft equipment.

Keywords:
Interaction of matter, electron-hole pairs, ionization defects, high-energy photon, MOSFET
References

1. Solov'ev, A.V. Konstruktivno-tehnologicheskie metody uluchsheniya elektricheskih harakteristik radiacionno stoykih mikroshem v usloviyah seriynogo proizvodstva / A.V. Solov'ev // Nanoindustriya. - 2020. - № S96-2. - S. 712-716. - DOI:https://doi.org/10.22184/1993-8578.2020.13.3s.712.716

2. Sozdanie bazisa dlya mikroshem sbora i obrabotki dannyh / V.A. Sklyar, A.V. Achkasov, K.V. Zol'nikov, I.I. Strukov, K.A. Chubur // Modelirovanie sistem i processov. - 2018. - T. 11, № 2. - S.66-71. - DOI:https://doi.org/10.12737/article_5b57795062f199.54387613

3. Analiz kachestva proektirovaniya blokov OZU v sostave mikroprocessornyh sistem s obespecheniem minimal'noy sboeustoychivosti / V.K. Zol'nikov, Yu.A. Chevychelov, V.V. Lavlinskiy, A.V. Achkasov, A.V. Tolkachev, O.V. Oksyuta // Modelirovanie sistem i processov. - 2019. - T. 12, № 4. - S. 47-55. -DOI:https://doi.org/10.12737/2219-0767-2020-12-4-47-55

4. Analiz proektirovaniya blokov RISC-processora s uchetom sboeustoychivosti / V.K. Zol'nikov, A.S. Yagodkin, V.I. Anciferova, S.A. Evdokimova, T.V. Skvorcova, A.I. Yan'kov // Modelirovanie sistem i processov. - 2019. - T. 12, № 4. - S. 56-65. - DOI:https://doi.org/10.12737/2219-0767-2020-12-4-56-65

5. Metody kontrolya nadezhnosti pri razrabotke mikroshem / K.V. Zol'nikov, S.A. Evdokimova, T.V. Skvorcova, A.E. Gridnev // Modelirovanie sistem i processov. - 2020. - T. 13, № 1. - S. 39-45. - DOI:https://doi.org/10.12737/2219-0767-2020-13-1-39-45

6. Opredelenie meropriyatiy po programme obespecheniya kachestva rabot proektirovaniya i seriynogo proizvodstva mikroshem i ocenki ih effektivnosti na primere SBIS 1867VN016 / K.V. Zol'nikov, A.S. Yagodkin, S.A. Evdokimova, T.V. Skvorcova // Modelirovanie sistem i processov. - 2020. - T. 13, № 1. - S. 46-53. -DOI:https://doi.org/10.12737/2219-0767-2020-13-1-46-53

7. Ocenka vozdeystviya ioniziruyuschih izlucheniy na elektronnye komponenty po rezul'tatam ispytaniy ogranichennyh vyborok / M.M. Venediktov, E.S. Obolenskaya, V.K. Kiselev, S.V. Obolenskiy // Zhurnal radioelektroniki. - 2017. - № 1. - S. 7.

8. Kombaev, T.Sh. Proektirovanie radiacionnoy zaschity kompleksa nauchnoy apparatury kosmicheskogo apparata distancionnogo zondirovaniya Zemli / T.Sh. Kombaev, M.E. Artemov, I.V. Zefirov // Inzhenernyy zhurnal: nauka i innovacii. - 2019. - № 5 (89). - S. 6. - DOI:https://doi.org/10.18698/2308-6033-2019-5-1878

9. Osobennosti tehnologicheskogo processa izgotovleniya mikroshem kosmicheskogo naznacheniya po tehnologii KMOP KNS / V.K. Zol'nikov, S.A. Evdokimova, I.V. Zhuravleva, E.A. Maklakova, A.A. Ilunina // Modelirovanie sistem i processov. - 2020. - T. 13, № 3. - S. 53-58. - DOI:https://doi.org/10.12737/2219-0767-2020-13-3-53-58

10. Zhuravleva, I.V. Osnovnye faktory ioniziruyuschih izlucheniy kosmicheskogo prostranstva, deystvuyuschie na mikroshemy / I.V. Zhuravleva // Modelirovanie sistem i processov. - 2019. - T. 12, № 3. - S. 11-16. -DOI:https://doi.org/10.12737/2219-0767-2019-12-3-11-16

11. Challenges and approaches to radiation hardness control of electronic components to in-space high-energy particles exposure / V. Anashin, P. Chubunov, A. Koziukov, A. Konyukhov, G. Protopopov // Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. 20. - 2018. - Pp. 31-34. - DOI:https://doi.org/10.1109/ISHCE.2018.8521206

12. Recent advances in beam monitoring during see testing on ISDE&JINR heavy ion facilities / V.S. Anashin, P.A. Chubunov, S.V. Mitrofanov, A.T. Isatov // INTERNATIONAL BEAM INSTRUMENTATION CONFERENCE (IBIC2018). - 2019. - S. 36-39. - DOI:https://doi.org/10.18429/JACoW-IBIC2018-mopa06

Login or Create
* Forgot password?