CREATING A TEST ENVIRONMENT AND HOW TO LOAD TESTS DURING CHIP DESIGN

Chubur K.; Kulay A.; Savchenko Andrey; Zolnikov Konstantin Vladimirovich; Gridnev A. E.

doi:doi:10.12737/2219-0767-2020-13-1-83-87

CREATING A TEST ENVIRONMENT AND HOW TO LOAD TESTS DURING CHIP DESIGN

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CREATING A TEST ENVIRONMENT AND HOW TO LOAD TESTS DURING CHIP DESIGN

Journal: MODELING OF SYSTEMS AND PROCESSES Volume 13 № 1 , 2020

Rubrics: TEHNICHESKIE NAUKI

UDK 60 Прикладные науки. Общие вопросы

Chubur K. ¹

Kulay A. ²

Savchenko Andrey ³

Zolnikov Konstantin Vladimirovich ⁴

Gridnev A. E.

Author and publication information

Authors:

1. FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation

2. AO «Nauchno-issledovatel'skiy institut elektronnoy tehniki»

3. AO «Nauchno-issledovatel'skiy institut mikropriborov» (g. Moskva)

4. AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

Russian Federation

Type:

Article

DOI:

https://doi.org/10.12737/2219-0767-2020-13-1-83-87

Pages:

from 83 to 87

Status:

Published

Received:

26.05.2020

Accepted:

26.05.2020

Published:

26.05.2020

Subject area:

UDK 60 Прикладные науки. Общие вопросы

Language:

Russian

Keywords:

microchips, microelectronics, design, tests, test loading

Abstract and keywords

Abstract (English):
The article discusses two main stages of the test loading process during chip design: performing the test procedure and copying the main program and running it. A detailed description of the tests is provided. When describing the loading process of the main program, special attention is paid to emergency situations that stop the loading process.

Keywords:
microchips, microelectronics, design, tests, test loading

References

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