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ANALYSIS OF THE DESIGN QUALITY OF RAM BLOCKS AS PART OF MICROPROCESSOR SYSTEMS WITH MINIMUM FAULT TOLERANCE
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ANALYSIS OF THE DESIGN QUALITY OF RAM BLOCKS AS PART OF MICROPROCESSOR SYSTEMS WITH MINIMUM FAULT TOLERANCE
UDK 62 Инженерное дело. Техника в целом. Транспорт
Zolnikov V. 1
Chevychelov Yu. Akimovich 2
Lavlinskiy V. 3
Achkasov A. Vladimirovich 4
Tolkachev Akim Vladimirovich 5
Oksyuta O. 6
Authors:
1.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
2.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
3.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
4.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
5.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh State University

6.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
Type:
Article
DOI:
https://doi.org/10.12737/2219-0767-2020-12-4-47-55
Pages:
from 47 to 55
Status:
Published
Received:
23.01.2020
Accepted:
23.01.2020
Published:
23.01.2020
Subject area:
UDK 62 Инженерное дело. Техника в целом. Транспорт
Language:
Russian
Keywords:
microprocessor, RAM, design, fault tolerance, heavy charged particles, biopolar effect, multibit events
Abstract and keywords
Abstract (English):
The article is devoted to the design of RAM blocks as part of microprocessor systems and methods for ensuring fault tolerance. The structural scheme of RAM and the process of influence of heavy charged particles on the integrated circuit (IC) of memory are considered. Special attention is paid to the influence of the biopolar effect on the fault stability of the IC elements, as well as to the emerging multibit events. The article analyzes the various phases of RAM operation and the reactions of memory circuit elements to the occurrence of failures caused by the hit of HCP.

Keywords:
microprocessor, RAM, design, fault tolerance, heavy charged particles, biopolar effect, multibit events
References

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