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STUDY OF SCHOTTKY DIODES FOR RESISTANCE FOR USE IN ELECTRONIC EQUIPMENT
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STUDY OF SCHOTTKY DIODES FOR RESISTANCE FOR USE IN ELECTRONIC EQUIPMENT
UDK 62 Инженерное дело. Техника в целом. Транспорт
Yankov A. Il'ich 1
Zolnikov Konstantin Vladimirovich 2
Kulay A. 3
Savchenko Andrey 4
Strukov I. 5
Evdokimova Svetlana Anatol'evna 6
Skvortsova Tatyana Vladimirovna 7
Yagodkin A. Sergeevich 8
Antsiferova V. 9
Kvasov Oleg Nikolaevich 10
Panova N. A. 11
Fesikova Oksana Valer'evna 12
Authors:
1.  LLC «SPE Detector»

Russian Federation
2.  AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

Russian Federation
3.  AO «Nauchno-issledovatel'skiy institut elektronnoy tehniki»

4.  AO «Nauchno-issledovatel'skiy institut mikropriborov» (g. Moskva)

5.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
6.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Voronezh, Russian Federation
7.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
8.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
9.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation
10.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

11.  Voronezh State Agrarian University named after Emperor Peter I

Voronezh State University of Forestry and Technologies named after G.F. Morozov

12.  Voronezh State University of Forestry and Technologies named after G.F. Morozov

Type:
Article
DOI:
https://doi.org/10.12737/2219-0767-2019-12-3-78-83
Pages:
from 78 to 83
Status:
Published
Received:
01.12.2019
Accepted:
01.12.2019
Published:
01.12.2019
Subject area:
UDK 62 Инженерное дело. Техника в целом. Транспорт
Language:
Russian
Keywords:
Schottky diodes, radioelectronics, durability, time of loss of operability, catastrophic failure.
Abstract and keywords
Abstract (English):
The article presents the method of evaluation and results of research Schottky diodes resistance for use in electronic equipment. Studies were carried out to determine the structural and technological reserves for durability. Also in the article the schemes of inclusion of Schottky diodes for measurement of direct reverse current and direct excitation of the diode applied at researches are considered.

Keywords:
Schottky diodes, radioelectronics, durability, time of loss of operability, catastrophic failure.
References

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